Please use this identifier to cite or link to this item:
http://ir.juit.ac.in:8080/jspui/jspui/handle/123456789/9257
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Abhilashia, L. K. | - |
dc.contributor.author | Sharma, P. | - |
dc.contributor.author | Rangra, V. S. | - |
dc.contributor.author | Sharma, P. | - |
dc.date.accessioned | 2023-01-17T08:49:00Z | - |
dc.date.available | 2023-01-17T08:49:00Z | - |
dc.date.issued | 2016 | - |
dc.identifier.uri | http://ir.juit.ac.in:8080/jspui/jspui/handle/123456789/9257 | - |
dc.description.abstract | The present work includes the optical properties of Sn13Se87-xSbx (x = 0, 3, 6, 9, 12) thin films prepared by vacuum evaporation technique (~ 10-4Pa). Thin films were characterized for the study of various optical properties like optical band gap )(Eoptg , absorption coefficient )( , refractive index (n) and extinction coefficient (k) by taking their transmission spectra in the range 400-2200 nm. The straightforward technique proposed by Swanepoel has been utilized to measure n and k. It has been observed that the value of n increases with the increase of Sb content. It has been observed that the optical gap is of indirect type and estimated using Tauc extrapolation. Optical gap decreases with increasing Sb content. The dielectric constants and optical conductivity has also been estimated using n, k and α. | en_US |
dc.language.iso | en | en_US |
dc.publisher | Jaypee University of Information Technology, Solan, H.P. | en_US |
dc.subject | Chalcogenide | en_US |
dc.subject | Optical gap | en_US |
dc.subject | Thin films | en_US |
dc.title | Effect of Antimony Addition on the Optical Behaviour of Snsesb Thin Films | en_US |
dc.type | Article | en_US |
Appears in Collections: | Journal Articles |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
Effect of Antimony Addition on the Optical Behaviour of SnSeSb Thin Films.pdf | 722.63 kB | Adobe PDF | View/Open |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.