A Study of Impurities (Ag, Bi & Ge) on the optical properties of Se-Te thin films

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DC Field	Value	Language
dc.contributor.author	Mainika	-
dc.contributor.author	Sharma, Pankaj	-
dc.contributor.author	Katyal, S.C	-
dc.contributor.author	Thakur, Nagesh	-
dc.date.accessioned	2023-01-16T10:57:43Z	-
dc.date.available	2023-01-16T10:57:43Z	-
dc.date.issued	2009	-
dc.identifier.uri	http://ir.juit.ac.in:8080/jspui/jspui/handle/123456789/9218	-
dc.description.abstract	Thin films of chemical composition Se80Te20, (Se80Te20)98Ag2, (Se80Te20)98Bi2 and (Se80Te20)98Ge2 are prepared by thermal evaporation technique. The optical properties of these thin films are determined by a method, based only on the transmission spectra at normal incidence, measured over the spectral range of 500-2500 nm. The dispersion of refractive index is discussed in terms of the single-oscillator Wemple and DiDomenico model. Optical energy gap (Eg) decreases while refractive index (n) increases on the incorporation of Bi addition in Se-Te system. On the other hand Eg increases while n and extinction coefficient (k) decreases on incorporation of Ag and Ge in Se-Te system. Results are interpreted in terms of cohesive energy (CE) and electronegativity (χ).	en_US
dc.language.iso	en	en_US
dc.publisher	Jaypee University of Information Technology, Solan, H.P.	en_US
dc.subject	Thin films	en_US
dc.subject	Refractive index	en_US
dc.subject	Optical energy gap	en_US
dc.subject	Cohesive energy	en_US
dc.title	A Study of Impurities (Ag, Bi & Ge) on the optical properties of Se-Te thin films	en_US
dc.type	Article	en_US
Appears in Collections:	Journal Articles

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