Please use this identifier to cite or link to this item: http://ir.juit.ac.in:8080/jspui/jspui/handle/123456789/5834
Full metadata record
DC FieldValueLanguage
dc.contributor.authorSharma, D.-
dc.contributor.authorSharma, P.-
dc.contributor.authorSingh, K. R.-
dc.contributor.authorThakur, N.-
dc.date.accessioned2022-08-18T04:33:58Z-
dc.date.available2022-08-18T04:33:58Z-
dc.date.issued2009-
dc.identifier.urihttp://ir.juit.ac.in:8080/jspui//xmlui/handle/123456789/5834-
dc.descriptionOPTOELECTRONICS AND ADVANCED MATERIALS – RAPID COMMUNICATIONS Vol. 3, No. 4, April 2009, p. 371 - 375en_US
dc.description.abstractIn the present work the optical properties polystyrene and iodine doped polystyrene films has been studied. Thin films of polystyrene and iodine doped polysterene were deposited on glass substrates by spin coating technique at 2000 rpm for 30s. Thin films were characterized by X-ray diffraction technique to check their amorphous nature. The basic optical properties of spun cast thin films were analyzed using their transmission spectra. The related parameters i.e. oscillator strength (Eo), dispersion energy (Ed) were determined by the Wemple-Didomenico single oscillator model. The refractive index (n), extinction coefficient (k) and dielectric constants of thin films were calculated. The optical band gap was calculated by Tauc’s extrapolation and is 1.19 eV and 2.14 eV for the polystyrene and iodine doped polystyrene thin films respectively. It has been found that both optical band gap and refractive index increases with the addition of iodine.en_US
dc.language.isoenen_US
dc.publisherJaypee University of Information Technology, Solan, H.P.en_US
dc.subjectPolystyreneen_US
dc.subjectSpun cast thin filmen_US
dc.subjectSpectroscopyen_US
dc.subjectRefractive indexen_US
dc.subjectOptical band gapen_US
dc.titleComparision of Optical Properties of Spun Cast Polystyrene and Iodine Doped Polystyrene Filmsen_US
dc.typeArticleen_US
Appears in Collections:Journal Articles



Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.