Please use this identifier to cite or link to this item:
http://ir.juit.ac.in:8080/jspui/jspui/handle/123456789/5126| Title: | An Optical study of Vacuume Vaporated Se85 xTe15Bix Chalcogenide Thin Films |
| Authors: | Ambika Barman, P.B. |
| Keywords: | Chalcogenide glasses Refractive index Cohesive energy Optical band gap |
| Issue Date: | 2010 |
| Publisher: | Jaypee University of Information Technology, Solan, H.P. |
| Abstract: | Thin filmsofSe85 xTe15Bix (x ¼ 0, 1,2,3,4,5)glassyalloyspreparedbymeltquenchingtechnique,are depositedonglasssubstrateusingthermalevaporationtechniqueundervacuum.Theanalysisof transmission spectra,measuredatnormalincidence,inthespectralrange400–1500nmhelphelpsusin the opticalcharacterizationofthinfilmsunderstudy.Well-knownSwanepoel’smethodisemployedto determine therefractiveindex(n) andfilmthickness(d). Theincreasein n with increasingBicontent overtheentirespectralrangeisrelatedtotheincreasedpolarizabilityofthelargerBiatom(atomic radius 1.46 A˚ ) comparedwiththeSeatom(atomicradius1.16 A˚ ). Dispersionenergy(Ed), averageenergy gap (E0) andstaticrefractiveindex(n0) isarecalculatedusingWemple–DiDomenicomodel(WDD). The valueofabsorptioncoefficient(a) andhenceextinctioncoefficient(k) hashavebeendetermined from transmissionspectra.Opticalbandgap(Eg) isestimatedusingTauc’sextrapolationandisfoundto decrease from1.46to1.24eVwiththeBiaddition.Thisbehaviorofopticalbandgapisinterpretedin terms ofelectronegativitydifferenceoftheatomsinvolvedandcohesiveenergyofthesystem. |
| Description: | Physica B 405(2010) 822–827 |
| URI: | http://ir.juit.ac.in:8080/jspui//xmlui/handle/123456789/5126 |
| Appears in Collections: | Journal Articles |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| An Optical study of Vacuume Vaporated Se85 xTe15Bix Chalcogenide Thin Films.pdf | 504.74 kB | Adobe PDF | View/Open |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.