Please use this identifier to cite or link to this item: http://ir.juit.ac.in:8080/jspui/jspui/handle/123456789/5123
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dc.contributor.authorMainika-
dc.contributor.authorSharma, Pankaj-
dc.contributor.authorKatyal, S C-
dc.contributor.authorThakur, Nagesh-
dc.date.accessioned2022-07-25T04:29:14Z-
dc.date.available2022-07-25T04:29:14Z-
dc.date.issued2008-
dc.identifier.urihttp://ir.juit.ac.in:8080/jspui//xmlui/handle/123456789/5123-
dc.descriptionJ. Phys. D: Appl. Phys. 41 (2008) 235301 (5pp) doi:10.1088/0022-3727/41/23/235301en_US
dc.description.abstractOptical constants (refractive index and extinction coefficient) have been studied for a-(Se80Te20)100−xGex (x = 0, 2, 4, 6) thin films using transmission spectra in the wavelength range 500–2500 nm. It is observed from optical transmission measurements that the optical energy gap (Eg) increases while the refractive index (n) and the extinction coefficient (k) decrease with the incorporation of Ge in the Se–Te system. The increase in the optical energy gap is interpreted by correlating the optical energy gap with the decrease in electronegativity and increase in the heat of atomization (Hs). The dispersion of the refractive index is discussed in terms of the single-oscillator Wemple–DiDomenico model.en_US
dc.language.isoenen_US
dc.publisherJaypee University of Information Technology, Solan, H.P.en_US
dc.subjectRefractive indexen_US
dc.subjectChalcogenide glassesen_US
dc.subjectThin Filmsen_US
dc.subjectOptical transmissionen_US
dc.titleAn Optical study of Amorphous (Se80Te20)100−xGex thin films using their Transmission Spectraen_US
dc.typeArticleen_US
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