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http://ir.juit.ac.in:8080/jspui/jspui/handle/123456789/5026| Title: | A Study of Impurities (Ag, Bi & Ge) on the optical properties of Se-Te thin films |
| Authors: | Mainika Sharma, Pankaj Katyal, S.C. Thakur, Nagesh |
| Keywords: | Thin films refractive index optical energy gap cohesive energy. |
| Issue Date: | 2009 |
| Publisher: | Jaypee University of Information Technology, Solan, H.P. |
| Abstract: | Thin films of chemical composition Se80Te20, (Se80Te20)98Ag2, (Se80Te20)98Bi2 and (Se80Te20)98Ge2 are prepared by thermal evaporation technique. The optical properties of these thin films are determined by a method, based only on the transmission spectra at normal incidence, measured over the spectral range of 500-2500 nm. The dispersion of refractive index is discussed in terms of the single-oscillator Wemple and DiDomenico model. Optical energy gap (Eg) decreases while refractive index (n) increases on the incorporation of Bi addition in Se-Te system. On the other hand Eg increases while n and extinction coefficient (k) decreases on incorporation of Ag and Ge in Se-Te system. Results are interpreted in terms of cohesive energy (CE) and electronegativity (χ). |
| Description: | Journal of Non-oxide Glasses Volume 1, No. 2, 2009, p. 90-95 |
| URI: | http://ir.juit.ac.in:8080/jspui//xmlui/handle/123456789/5026 |
| Appears in Collections: | Journal Articles |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| A Study of Impurities Ag Bi and Ge on the optical properties of Se Te thin films.pdf | 261.24 kB | Adobe PDF | View/Open |
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